Wafer with Window Monocrystalline Silicon Substrate Coated for Infrared Applications - Diameter 25-105mm, Thickness 0.5mm (82mm)
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Description
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Monocrystalline silicon substrate designed for infrared applications, ensuring optimum performance in windows and IR detectors. Available in a range of diameters from 25mm to 105mm with a constant thickness of 0.5mm, perfect for various optical configurations. Exceptional dimensional tolerance of +/- 0.02mm, which ensures precision for critical optical applications. Brightness index of 20/10 or higher, which improves clarity and imaging and infrared detection. Customizable coatings are available, including AR and BBAR, to meet specific requirements for different infrared applications.
Description
(1)
Monocrystalline silicon substrate designed for infrared applications, ensuring optimum performance in windows and IR detectors. Available in a range of diameters from 25mm to 105mm with a constant thickness of 0.5mm, perfect for various optical configurations. Exceptional dimensional tolerance of +/- 0.02mm, which ensures precision for critical optical applications. Brightness index of 20/10 or higher, which improves clarity and imaging and infrared detection. Customizable coatings are available, including AR and BBAR, to meet specific requirements for different infrared applications.
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