€ 95.32
Coated Monocrystalline Silicon Substrate Wafer for Infrared Applications - 25-105mm Diameter, 0.5mm Thickness (82mm)
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High-quality monocrystalline silicon substrate wafers designed for infrared applications and ensure optimal performance in IR windows and detectors. Available in diameters from 25 mm to 105 mm with a uniform thickness of 0.5 mm, perfect for various optical setups. Exceptional dimensional tolerance of +/-0.02 mm, which guarantees precision and reliability for your optical needs. High brightness rating of 20/10 or better, which improves image sharpness and performance in thermal imaging and IR spectrometry. Customizable coatings are available, including AR and BBAR to meet specific application requirements for improved light transmission.
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High-quality monocrystalline silicon substrate wafers designed for infrared applications and ensure optimal performance in IR windows and detectors. Available in diameters from 25 mm to 105 mm with a uniform thickness of 0.5 mm, perfect for various optical setups. Exceptional dimensional tolerance of +/-0.02 mm, which guarantees precision and reliability for your optical needs. High brightness rating of 20/10 or better, which improves image sharpness and performance in thermal imaging and IR spectrometry. Customizable coatings are available, including AR and BBAR to meet specific application requirements for improved light transmission.
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