Monocrystalline Silicon Substrate Wafer Coated for Infrared Applications - Diameter 25-105mm, Thickness 0.5mm (27mm)
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Description
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High quality monocrystalline silicon substrate wafers designed for infrared applications, ensuring optimum performance in windows and infrared detectors. Available in diameters ranging from 25mm to 105mm with a uniform thickness of 0.5mm, perfect for different optical configurations. Exceptional dimensional tolerance of +/-0.02mm, which ensures precision and reliability for your optical needs. High brightness of 20/10 or higher, which improves clarity and performance in thermal imaging and IR spectrometry. Customizable coatings are available, including AR and BBAR, to meet specific application requirements for better light transmission.
Description
(1)
High quality monocrystalline silicon substrate wafers designed for infrared applications, ensuring optimum performance in windows and infrared detectors. Available in diameters ranging from 25mm to 105mm with a uniform thickness of 0.5mm, perfect for different optical configurations. Exceptional dimensional tolerance of +/-0.02mm, which ensures precision and reliability for your optical needs. High brightness of 20/10 or higher, which improves clarity and performance in thermal imaging and IR spectrometry. Customizable coatings are available, including AR and BBAR, to meet specific application requirements for better light transmission.
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