Wafer with Window in Monocrystalline Silicon Substrate Coated for Infrared Applications - Diameter 25-105mm, Thickness 0.5mm (30mm)
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Monocrystalline silicon substrate designed for infrared applications, which ensures optimal performance in windows and IR detectors. Available in a range of diameters from 25mm to 105mm, with a constant thickness of 0.5mm for versatile use in various optical systems. Exceptional dimensional tolerance of +/-0.02mm, ensuring accuracy and reliability for critical optical applications. Higher brightness value of 20/10 or higher, which ensures high light transmission and minimal distortion for improved images. Customizable coatings are available, including AR and BBAR, to meet specific application needs of infrared cameras, thermal cameras and spectrometers.
Description
(1)
Monocrystalline silicon substrate designed for infrared applications, which ensures optimal performance in windows and IR detectors. Available in a range of diameters from 25mm to 105mm, with a constant thickness of 0.5mm for versatile use in various optical systems. Exceptional dimensional tolerance of +/-0.02mm, ensuring accuracy and reliability for critical optical applications. Higher brightness value of 20/10 or higher, which ensures high light transmission and minimal distortion for improved images. Customizable coatings are available, including AR and BBAR, to meet specific application needs of infrared cameras, thermal cameras and spectrometers.
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