Featured
Compare webshops (2)
Pages: 136, Paperback, Independently published
Independently Published
SEMICONDUCTOR PROCESS VARIATION and Design ROBUSTNESS: Statistical Modeling Yield Prediction Tolerance Driven
Springer
Statistical Modeling and Computation
SEMICONDUCTOR FABRICATION YIELD ENGINEERING: Process Control Statistical Methods and Defect Density Reduction
Six Sigma with R: Statistical Engineering for Process Improvement: 36
Back to top