Coated Monocrystalline Silicon Substrate Window Wafer for Infrared Applications - 25-105mm Diameter, 0.5mm Thickness (72mm)
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Description
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The monocrystalline silicon substrate has been developed for infrared applications and ensures optimal performance in IR windows and detectors. Available in diameters from 25mm to 105mm, with a uniform thickness of 0.5mm for versatile applications in various optical systems. Exceptional dimensional tolerance of +/-0.02 mm, ensuring precision and reliability for critical optical applications. Excellent brightness rating of 20/10 or better, which ensures high light transmission and minimal distortion for improved imaging. Customizable coatings are available, including AR and BBAR to meet the specific application requirements of IR cameras, thermal imagers and spectrometers.
Description
(1)
The monocrystalline silicon substrate has been developed for infrared applications and ensures optimal performance in IR windows and detectors. Available in diameters from 25mm to 105mm, with a uniform thickness of 0.5mm for versatile applications in various optical systems. Exceptional dimensional tolerance of +/-0.02 mm, ensuring precision and reliability for critical optical applications. Excellent brightness rating of 20/10 or better, which ensures high light transmission and minimal distortion for improved imaging. Customizable coatings are available, including AR and BBAR to meet the specific application requirements of IR cameras, thermal imagers and spectrometers.
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