Coated Monocrystalline Silicon Substrate Window Wafer for Infrared Applications - 25-105mm Diameter, 0.5mm Thickness(62mm)
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Description
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monocrystalline silicon substrate devised for infrared applications, ensuring optimal performance in IR windows and detectors. Available in a range of diameters from 25mm to 105mm, with a consistent thickness of 0.5mm for versatile use in various optical systems. Exceptional dimensional tolerance of +/-0.02mm, providing precision and reliability for critical optical applications. Superior brightness rating of 20/10 or better, ensuring high light transmission and minimal distortion for enhanced imaging . Customizable coatings available, including AR and BBAR, to meet specific application needs for IR cameras, thermal imagers, and spectrometers.
Description
(1)
monocrystalline silicon substrate devised for infrared applications, ensuring optimal performance in IR windows and detectors. Available in a range of diameters from 25mm to 105mm, with a consistent thickness of 0.5mm for versatile use in various optical systems. Exceptional dimensional tolerance of +/-0.02mm, providing precision and reliability for critical optical applications. Superior brightness rating of 20/10 or better, ensuring high light transmission and minimal distortion for enhanced imaging . Customizable coatings available, including AR and BBAR, to meet specific application needs for IR cameras, thermal imagers, and spectrometers.
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