Atomic force microscopy: Scanning probe microscopy, tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre

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Atomic force microscopy: Scanning probe microscopy, tunneling microscope, Heinrich Rohrer, IBM Research - Zurich, Piezoelectricity, Nanometre

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Brand OmniScriptum
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  • 9786132722157

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